An alternate method for achieving temperature control in the -130 C to 75 C range

Thermal vacuum testing often requires temperature control of chamber shrouds and heat exchangers within the -130 C to 75 C range. There are two conventional methods which are normally employed to achieve control through this intermediate temperature range: (1) single-pass flow where control is achieved by alternately pulsing hot gaseous nitrogen (GN2) and cold LN2 into the feed line to yield the setpoint temperature; and (2) closed-loop circulation where control is achieved by either electrically heating or LN2 cooling the circulating GN2 to yield the setpoint temperature. A third method, using a mass flow ratio controller along with modulating control valves on GN2 and LN2 lines, provides excellent control but equipment for this method is expensive and cost-prohibitive for all but long-term continuous processes. The single-pass method provides marginal control and can result in unexpected overcooling of the test article from even a short pulse of LN2. The closed-loop circulation method provides excellent control but requires an expensive blower capable of operating at elevated pressures and cryogenic temperatures. Where precise control is needed (plus or minus 2 C), single-pass flow systems typically have not provided the precision required, primarily because of overcooling temperature excursions. Where several individual circuits are to be controlled at different temperatures, the use of expensive cryogenic blowers for each circuit is also cost-prohibitive, especially for short duration of one-of-a-kind tests. At JPL, a variant of the single-pass method was developed that was shown to provide precise temperature control in the -130 C to 75 C range while exhibiting minimal setpoint overshoot during temperature transitions. This alternate method uses a commercially available temperature controller along with a GN2/LN2 mixer to dampen the amplitude of cold temperature spikes caused by LN2 pulsing. The design of the GN2/LN2 mixer, the overall control system configuration, the operational procedure, and the prototype system test results are described

A new approach for performing contamination control bakeouts in JPL thermal vacuum test chambers

Contamination control requirements for the Wide Field/Planetary Camera II (WF/PC II) are necessarily stringent to protect against post-launch contamination of the sensitive optical surfaces, particularly the cold charge coupled device (CCD) imaging surfaces. Typically, thermal vacuum test chambers have employed a liquid nitrogen (LN2) cold trap to collect outgassed contaminants. This approach has the disadvantage of risking recontamination of the test article from shroud offgassing during post-test warmup of the chamber or from any shroud warming of even a few degrees during the bakeout process. By using an enclave, essentially a chamber within a chamber, configured concentrically and internally within an LN2 shroud, a method was developed, based on a design concept by Taylor, for preventing recontamination of test articles during bakeouts and subsequent post-test warmup of the vacuum chamber. Enclaves for testing WF/PC II components were designed and fabricated, then installed in three of JPL's Environmental Test Lab chambers. The design concepts, operating procedures, and test results of this development are discussed